Semiconductor Wafer Test System | Books - Writing - Speaking

Introduction of new surfscan SP2XP, a whole new watch for wafer inspection program for the included signal has generated a roaring success on its forerunner software using the same brand. The revolutionary wafer inspection program options increased level of responsiveness to blemishes on silicon, poly and metallic flicks. It also is able to form blemishes because of the type and size. This new semiconductor wafer inspection program also options machine managing and best-in-course throughput.

This technique is fashioned and built help facilitate chipmakers to usher in their systems on the industry with fine quality plus in small period of time. This method comes with an included extra higher level of responsiveness working manner to speed up is essential pozycjonowanie stron development of upcoming era systems.

This SP2 program is ideal for 65 and 45 nm nodes and down below. This ease in new Ultra violet laserlight technological know-how, darkish discipline optics and superior calculations. This tool is formulated to frequently produce reliable and accurate blemishes in manufactured substrates. This tool is designed to identify trouble shapes of 6 nm or maybe more in the multilayered wafer shapes with a reasonably higher speed. The untrue security charge is designed to be lower than .5 incidences every processor chip. The performance is realized utilizing the visual set up plus the electronic pattern style info. The primary function of digital pattern style info is to isolate the substandard areas into diverse layers, daemon tools pobierz so that you can facilitate the solitude in the blemishes. The graphic is processed in a overlook an image processer which includes high-speed pipe methodized and which could identify for blemishes with a training video charge of 7 the mega hertz.

This semiconductor wafer inspection program technological know-how is designed to target yourwants to quickly identify the substandard products in order that the issue will be fixed more rapidly. To more rapidly smaller is the wafer little bit, produce decline and industry hesitate. Fraxel treatments is considered to actually boost the creation of technologically advanced systems with small blemishes with a smaller timeframe.

The advantages of the surfscan SP2XP watch wafer inspection program involve thirty seven pozycjonowanie per-cent improves within the throughput caused by alterations in opto-motion, gadgets and computer software. The numerous channel design lets the wafer inspection program to immediately separate dust from micro scratches, voids, normal water signifies etcetera. Extra higher level of responsiveness manner lets the computer to get used for development of upcoming era poker chips. The roll-out of Opto-motion has been proven as effective in uncovering blemishes even over abrasive flicks. The revolutionary differential disturbance compare channel lets catch of low, flat and pass out blemishes which can result in malfunction of systems at superior systems. The trouble measurement capacity lets uncovering blemishes at higher speed with larger accuracy.

Source: http://www.thebooklistings.org/books/semiconductor-wafer-test-system/

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